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Surface and Thin Film Analysis

A Compendium of Principles, Instrumentation, and Applications
LivreRelié
Classement des ventes 6905dansChimie
CHF200.00

Description

Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.

Détails

ISBN/GTIN978-3-527-32047-9
Type de produitLivre
ReliureRelié
ÉditeurWiley-VCH
Date de parution20.04.2011
Edition2. vollst. überarb. u. erw. Auflage
Pages558 pages
LangueAnglais
DimensionsLargeur 170 mm, Hauteur 240 mm, Épaisseur 31 mm
Poids1208 g
IllustrationsTabellen, schwarz-weiss, schwarz-weiss Illustrationen, farbige Illustrationen
Groupe de produitsSciences naturelles
CatégorieChimie
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Auteur

Gernot Friedbacher is Associate Professor of Analytical Chemistry at the Vienna University of Technology. His research activities are focused on investigation of surfaces and surface processes with scanning probe microscopy and electron probe x-ray microanalysis covering a broad field of applications ranging from basic research on thin film systems to materials science. Over the last decades he has held numerous theoretical and practical courses in the field of analytical chemistry with emphasis on intstrumental analysis and surface- and interface analysis. Prof. Friedbacher has published over 120 research articles, reviews, and book chapters. Henning Bubert worked at the Institut für Analytische Wissenschaften - ISAS - (Institute for Analytical Sciences) in Dortmund until his retirement in 2003. He is currently working as guest scientist. His research activities are mainly focused on investigation of surfaces and thin films by electron spectroscopy related to the development and application of new materials in mechanical engineering. He has published over 110 research articles, reviews, and book chapters.

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